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The introduction to this article provides insufficient context for those unfamiliar with the subject. Please help improve the article with a good introductory style. (June 2011) "STEM study" redirects here. For investigations involving stem cells, see Stem cell research. A STEM equipped with a 3rd-order spherical aberration corrector Inside the corrector (hexapole-hexapole type) A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). As with any transmission illumination scheme, the electrons pass through a sufficiently thin specimen. However, STEM is distinguished from conventional transmission electron microscopes (CTEM) by focusing the electron beam into a narrow spot which is scanned over the sample in a raster. The rastering of the beam across the sample makes these microscopes suitable for analysis techniques such as mapping by energy dispersive X-ray (EDX) spectroscopy, electron energy loss spectroscopy (EELS) and annular dark-field imaging (ADF). These signals can be obtained simultaneously, allowing direct correlation of image and quantitative data. By using a STEM and a high-angle detector, it is possible to form atomic resolution images where the contrast is directly related to the atomic number (z-contrast image). The directly interpretable z-contrast image makes STEM imaging with a high-angle detector appealing. This is in contrast to the conventional high resolution electron microscopy technique, which uses phase-contrast, and therefore produces results which need interpretation by simulation. Contents 1 History 2 Aberration correction 3 Room environment 4 Biological application 4.1 Low-voltage electron microscope (LVEM) 5 Electron energy loss spectroscopy 6 See also 7 References 8 External links History Microscope schematic In 1925, Louis de Broglie first theorized the wave-like properties of an electron, with a wavelength substantially smaller than visible light.[1] This would allow the use of electrons to image objects much smaller than the previous diffraction limit set by visible light. The first STEM was built in 1938 by Baron Manfred von Ardenne,[2][3] working in Berlin for Siemens. However, the results were inferior to that of TEM at the time, and von Ardenne only spent two years working on the problem. The microscope was destroyed in an air raid in 1944, and von Ardenne did not return to the field after WWII.[4] The technique did not become developed until the 1970s, with Albert Crewe at the University of Chicago developing the field emission gun[5] and adding a high quality objective lens to create the modern STEM, and demonstrated the ability to image atoms using ADF. Crewe and coworkers at the University of Chicago developed the cold field emission electron source and built a STEM able to visualize single heavy atoms on thin carbon substrates.[6] Aberration correction Aberration corrected machines have provided electron probes with sub-angstrom dimensions. This has enabled a new regime of atomic imaging. Room environment High resolution scanning transmission electron microscopes require exceptionally stable room environments. In order to obtain atomic resolution imaging the room must have a limited amount of room vibration, temperature fluctuations, electromagnetic waves, and acoustic waves. Biological application The first application of this method to the imaging of biological molecules was demonstrated in 1971.[7] The motivation for STEM imaging of biological samples is particularly to make use of dark-field microscopy, where the STEM is more efficient than a conventional TEM, allowing high contrast imaging of biological samples without requiring staining. The method has been widely used to solve a number of structural problems in molecular biology.[8][9][10] Low-voltage electron microscope (LVEM) The low-voltage electron microscope (LVEM) is a combination of SEM, TEM and STEM in one instrument, which operated at relatively low electron accelerating voltage of 5 kV. Low voltage increases image contrast which is especially important for biological specimens. This increase in contrast significantly reduces, or even eliminates the need to stain. Sectioned samples generally need to be thinner than they would be for conventional STEM (20–70 nm). Resolutions of a few nm are possible in TEM, SEM and STEM modes.[11][12] Electron energy loss spectroscopy Electron energy loss spectroscopy (EELS) as a STEM measurement technique made possible with the addition of an electron spectrometer. The high-energy convergent electron beam in STEM provides local information of the sample, even down to atomic dimensions. With the addition of EELS, elemental identification is possible and even additional capabilities of determining electronic structure or chemical bonding of atomic columns. The low-angle inelastically scattered electrons used in EELS compliments the high-angle scattered electrons in ADF images by allowing both signals to be acquired simultaneously. EELS is a technique popular to STEM microscopists. See also Electron beam induced deposition Electron diffraction Electron energy loss spectroscopy (EELS) Electron microscope Energy filtered transmission electron microscopy (EFTEM) High-resolution transmission electron microscopy (HRTEM) Low-voltage electron microscopy (LVEM) Scanning confocal electron microscopy Scanning electron microscope (SEM) Transmission Electron Aberration-corrected Microscope References ^ de Broglie (1925). "Recherches sur la Theorie des Quanta". Ann.Phys. 3: 22–128.  ^ von Ardenne, M (1938). "Das Elektronen-Rastermikroskop. Theoretische Grundlagen". Z Phys 109 (9–10): 553–572. Bibcode 1938ZPhy..109..553V. doi:10.1007/BF01341584.  ^ von Ardenne, M (1938). "Das Elektronen-Rastermikroskop. Praktische Ausführung". Z tech Phys 19: 407–416.  ^ D. McMullan, SEM 1928 - 1965 ^ Crewe, Albert V; Isaacson, M. & Johnson, D. (1969). "A Simple Scanning Electron Microscope". Rev. Sci. Inst. 40 (2): 241–246. Bibcode 1969RScI...40..241C. doi:10.1063/1.1683910.  ^ Crewe, Albert V; Wall, J. & Langmore, J. (1970). "Visibility of a single atom". Science 168 (3937): 1338–1340. Bibcode 1970Sci...168.1338C. doi:10.1126/science.168.3937.1338. PMID 17731040.  ^ Wall, J.S., 1971 "A high resolution scanning electron microscope for the study of single biological molecules" PhD thesis, University of Chicago ^ Wall JS, Hainfeld JF (1986). "Mass mapping with the scanning transmission electron microscope". Annu Rev Biophys Biophys Chem 15: 355–76. doi:10.1146/annurev.bb.15.060186.002035. PMID 3521658.  ^ Hainfeld JF, Wall JS (1988). "High resolution electron microscopy for structure and mapping". Basic Life Sci 46: 131–47. PMID 3066333.  ^ Wall JS, Simon MN (2001). "Scanning transmission electron microscopy of DNA-protein complexes". Methods Mol Biol 148: 589–601. doi:10.1385/1-59259-208-2:589. ISBN 1-59259-208-2. PMID 11357616.  ^ Nebesářová1, Jana; Vancová, Marie (2007). "How to Observe Small Biological Objects in Low-Voltage Electron Microscope". Microscopy and Microanalysis 13 (3): 248–249. doi:10.1017/S143192760708124X.  ^ Drummy, Lawrence, F.; Yang, Junyan; Martin, David C. (2004). "Low-voltage electron microscopy of polymer and organic molecular thin films". Ultramicroscopy 99 (4): 247–256. doi:10.1016/j.ultramic.2004.01.011. PMID 15149719.  External links The Wikibook Nanotechnology has a page on the topic of Transmission electron microscopy (TEM) WEELS - Websource for Electron Energy Loss Spectra Optimizing Your Microscope About STEM